Latch-Up ESD Test Systems

Rent Latch-up test equipment for ESD pulse injection.

Order advanced ESD test systems for charged device model (CDM), human body model (HBM) and machine model (MM) with turnkey latch up ESD systems. Compliance standards include IEC 60749-26, Mil-STD-883, ANSI/ESD STM5.1-2001, ANSI/ESD STM5.2-1999, JEDEC EIA/JESD22, GB/T17626 IEC61000-4-2 and IEC 61000-4-2 (HMM - Human Metal Model). Additional options for Charged Device (CDM) ESD testing available.

Also see - HBM/MM ESD Simulators


  • 3ctest EDS 10IC HBM and MM ESD Immunity Tester IC Test Socket - ESD Human Body Model and Machine Model ESD Test System

    3ctest 3ctest EDS 10IC HBM and MM ESD Immunity Tester

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    The 3ctest EDS 10IC is specially designed for HBM and MM ESD immunity test requirements, applicable to semiconductor devices like LED, transistors, IC, etc, as per IEC, ESDA, JEDEC, MIL, etc. At the same time, fully comply with the severest ESD voltage levels in the standards above. Rent, buy or lease the 3ctest EDS 10IC HBM and MM ESD Immunity Tester.  3ctest EDS 10IC Features: Touch screen intelligent operation Automatic identify RC modules and adjust the maximum voltage The lowest voltage 5V and 1V step for precise adjusting voltage Available for single or automatic discharge tests and setting times, frequency, etc Meets: ESDA ANSI/ ESD STM5.2-2009 JEDEC JESD22- A114E Jan.2007 ANSI /ESD-STM5.1 2007 MIL-STD-883G 28 Feb.2006 ANSI/JEDEC JS-001-2010 JEDEC JESD22- A115C Nov.2010

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    $165.00 - $1,795.00

  • Langer-EMV P331-2 ESD Pulse Injection Generator probe for IEC 61000-4-2 compliance, used in IC and PCB immunity testing applications. Complete Langer-EMV P331-2 ESD Pulse Injection Generator IC test system kit with probe, cables, and accessories in a carry case for lab use.

    Langer EMV Langer-EMV P331-2 ESD Pulse Injection Generator

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    The P331-2 set is used for injecting ESD pulses into ICs. The P331-2 ESD generator orientates itself by mechanisms of the ESD coupling into electronic assemblies (according to IEC 61000-4-2 / HMM). The BPS 203 burst power station supplys and controls the P331-2 pulse generator. The Langer P331-2 ESD pulse injection generator is used for conducted ESD coupling in accordance with standard IEC 61000-4-2 (system level) / HMM (Human Metal Model - component level, acc. to ANSI/ESD SP5.6-2009) directly into IC pins or in conjunction with couplers for coupling into special high-speed interface pins such as USB, LVDS, Ethernet etc.

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    $295.00 - $2,495.00

  • Elecro Tech Systems (ETS) 9910 Multi-Pin ESD Simulator for Microelectronic Devices - ESDGuns.com

    Electro Tech Systems Elecro Tech Systems (ETS) 9910 Multi-Pin ESD Simulator for Microelectronic Devices

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    Electrostatic discharge (ESD) has become a significant factor contributing to the disruption of electronic equipment or the premature failure of microelectronic devices in both the field and during the manufacturing process. Sensitivities below 30V are now common. Since it is not always possible to control the environment where electronic devices are used or handled, the burden of product reliability falls upon the manufacturer to design and build equipment with reduced susceptibility to ESD. The Model 9910 ESD Simulator is an invaluable tool in developing components for use in today’s military, industrial and consumer applications. The Elecro Tech Systems (ETS) 9910 Multi-Pin ESD Simulator for Microelectronic Devices is a bench top ESD Simulator designed for laboratory or low pin count testing. The Model 9910 is a microprocessor-based instrument that can be operated manually via the front panel keyboard or by computer control. Voltage is adjustable in 1 Volt increments. In addition, the user can program up to 9 preset voltages from ±5 to 8250V. Two modes of operation are available: In MANUAL mode, a Discharge is initiated each time the DISCHARGE button is depressed. In the AUTO mode, the number of discharges (0-99) and the interval (1-99 sec.), selected by the user, are activated when the DISCHARGE button is depressed. Typically, each device pin combination is tested at both polarities using 3 discharges at 1 second intervals. The discharge circuit consists of mercury high voltage relays for bounce-free operation, programmable selection of HBM, MM or CDM (optional) testing plus a switched output for connecting the Device Under Test (DUT) pin to a curve tracer or similar instrument. The Model 9910 also offers the optional capability to connect 2-5 additional discharge channels to the DUT (ground remains common). Each channel is selected by the user in the keyboard mode by pressing the appropriate key or by the computer in the Computer Control mode.

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    $0.00

  • NoiseKen ESS-6002 Component Level Electrostatic Discharge Simulator

    Noiseken ESD Simulators NoiseKen ESS-6002 Component Level Electrostatic Discharge Simulator

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    The NoiseKen ESS-6002 Component Level Electrostatic Discharge Simulator is a tester specifically designed to carry out ESD sensitivity testing of semiconductor devices to standards such as MIL-STD-883, EIAJ ED-4701 and others. Included are the Human Body Model (HBM) and Machine Model (MM) probes.  As a DUT interface, select either Free Type Probe Stand where virtually any package type can be connected by means of a pair of miniature test leads or Semi-automatic Precision Type Probe Stand providing automatic and precise pin-to-pin feeding with a minimum 0.01mm resolution. Meets Human Body Model (HBM) Compliance Standards: AEC-Q100-002-Rev.D Jul.2003 ESDA ANSI/EOS/ESD-STM5.1-2001 IEC 61340-3-1Ed.1.0 2002 IEC 60749-26 Ed.1.0 2003 JEDEC JESD22-A114E Jan 2007 JEITA EIAJ ED-4701/300 Aug.2001 Test Method304 MIL-STD-883G Method 3015.7 Mar.1989 Meets Machine Model (MM) Compliance Standards: AEC-Q100-003-REV-E  Jul.2003 ESDA ANSI/ESD STM5.2-1999 IEC 61340-3-2 Ed.1.0-2002 IEC 60749-27 Ed.1.0 2003 JEDEC JESD22-A115A Oct.1997 JEITA EIAJ ED-4701/300 Aug.2001 NoiseKen ESS-6002 Features: 10V minimum output (1V step) A simple probe stand and test fixture plus a pair of miniature test leads meeting many different kinds of device packages <Free Board Type> Narrow pitch DUT can be tested in semi-automatic manner <Semi-automatic Precision Type> Each probe has a coaxial interface with an external measuring instrument. External trigger input and output terminals are provided.

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    $19,750.00

  • Keytek (Thermo Fisher) ZapMaster ESD Test System for HBM, MM ESD, Latch-Up, & CDM

    Thermo Keytek Keytek (Thermo Fisher) RCDM3 Charged Device Model (CDM) PC Controlled ESD System

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    Keytek (Thermo Fisher) RCDM3 Description: The KeyTek RCDM3 is a robotic style Charged Device Model (CDM) test system enabling the identification of CDM ESD threats to new devices prior to design release, or for postproduction failure analysis simulation. A turnkey PC-controlled system, RCDM3 features three independent video cameras and a built in vacuum ‘device retention’ system for rapid set-up. Devices of virtually any size or configuration can be stressed. The system provides efficient testing regimens and easily retrievable test data. Available with ESDA STM 5.3.1, JEDEC JESD22-C101 standards, or both. Test standards ESDA STM 5.3.1 or JEDEC, JESD22-C101 standards, or both 3 independent video cameras allow fast precision device alignment Built-in vacuum device hold-down system Accommodates testing of virtually any size device package Zap detection circuit for confirmed discharge event Safety interlocks guard operator safety

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    $5,000.00

  • Keytek (Thermo Fisher) ZapMaster ESD Test System for HBM, MM ESD, Latch-Up, & CDM

    Thermo Keytek Keytek (Thermo Fisher) ZapMaster ESD Test System for HBM, MM ESD, Latch-Up, & CDM

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    The Keytek ZapMaster is a automated, high-speed ESD test system developed to test ICs and advanced electronic devices. The ZapMaster system can be configured from 64 pin (Model 7/1) to a 256 pin (Model 7/4) system in 64 pin increments. The ZapMaster delivers clean repeatable waveforms to any pin or combination of pins via a fully automated switching matrix and will test up to 8 devices simultaneously. The ZapMaster will supply precise ESD stimuli to selected pin devices and perform failure analysis via a rapid curve trace and optional Vcc/Icc measurements before and after each zap or series of zaps. As zap levels are increased for each series of zaps, failures are detected through a number of user defined failure criteria. The resulting data is displayed, analyzed and stored. The ZapMaster performs ESD, latch-up and socketed CDM testing to a variety of standards and range of voltages. Meets Human Body Model (HBM) Compliance Standards: MIL-STD-883D; 50V to 8kV MIL-STD-883D; 10V to 2.2kV MIL-STD-883D; 25V to 6kV MIL-STD-883D; 50V to 12.5kV ESD Association 5.1; 50V to 8kV IEC 61000-4-2; 50V to 8kV JESD22-A114 Meets Machine Model (MM) Compliance Standards: JESD22-A115; 25V - 2kV ESD Association 5.2; 25V - 2kV AEC Standard; 50V - 1.5kV EIA/J Standard; 25V - 2kV Socketed Charged Device Model (CDM) Latch-up JEDEC 17 EIA/J ESD Induced 200pF/0W , 5V to 800V EIA/J ESD Induced 500pF/0W , 5V to 800V    

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    $5.00 - $15.00

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