The Keytek ZapMaster is a automated, high-speed ESD test system developed to test ICs and advanced electronic devices.
The ZapMaster system can be configured from 64 pin (Model 7/1) to a 256 pin (Model 7/4) system in 64 pin increments.
The ZapMaster delivers clean repeatable waveforms to any pin or combination of pins via a fully automated switching matrix and will test up to 8 devices simultaneously. The ZapMaster will supply precise ESD stimuli to selected pin devices and perform failure analysis via a rapid curve trace and optional Vcc/Icc measurements before and after each zap or series of zaps. As zap levels are increased for each series of zaps, failures are detected through a number of user defined failure criteria. The resulting data is displayed, analyzed and stored.
The ZapMaster performs ESD, latch-up and socketed CDM testing to a variety of standards and range of voltages.
Meets Human Body Model (HBM) Compliance Standards:
- MIL-STD-883D; 50V to 8kV
- MIL-STD-883D; 10V to 2.2kV
- MIL-STD-883D; 25V to 6kV
- MIL-STD-883D; 50V to 12.5kV
- ESD Association 5.1; 50V to 8kV
- IEC 61000-4-2; 50V to 8kV
- JESD22-A114
Meets Machine Model (MM) Compliance Standards:
- JESD22-A115; 25V - 2kV
- ESD Association 5.2; 25V - 2kV
- AEC Standard; 50V - 1.5kV
- EIA/J Standard; 25V - 2kV
Socketed Charged Device Model (CDM) Latch-up
- JEDEC 17
- EIA/J ESD Induced 200pF/0W , 5V to 800V
- EIA/J ESD Induced 500pF/0W , 5V to 800V
