Replace bad air discharge and contact discharge tips. Unique test tips available for fast rise time and other tests.
Replace bad air discharge and contact discharge tips. Unique test tips available for fast rise time and other tests.
For use with Teseq NSG 437 or Teseq NSG 438 ESD simulator systems
$395.00
The Haefely 4700526 30kV Air Discharge Tip is for use with Haefely ONYX16 or ONYX30 ESD generators.
$450.00
DIAGNOSTIC E-FIELD SIMULATION: to identify EUT locations sensitive to both static and dynamic E-fields, using super-fast, real-world risetimes. The Model MZT-11 E-Field Simulation Tip provides: • Repeatable, local static E-field simulation. Used for interrogating high-impedance circuits for upsets due to various levels of fixed or slowly-changing electric fields. • Repeatable, fast-risetime, local dynamic E-field simulation, while simultaneously minimizing the effects of local ESD-generated H-fields. Used for repeatably simulating the steep change in E-field associated with an ESD. The purpose is to isolate circuits sensitive to the real-world ESD E-field, which can often have sub-nanosecond edges. To ensure a fast E-field risetime, the Model MZT-11 E-field simulating tip is driven by the MiniZap’s contact mode simulation circuits, NOT by a slow, air-gap discharge as in some other ESD simulators.
$0.00
DIAGNOSTIC H-FIELD SIMULATION: to identify EUT locations sensitive to dynamic H-fields, using super-fast, real-world risetimes. The Model MZT-12 H-Field Simulation Tip provides: • Repeatable, local dynamic H-field simulation, while simultaneously minimizing the magnitude of local ESD-generated E-fields. Analogous with dynamic E-field simulation, the purpose of diagnostic H-field simulation is to isolate circuits sensitive to real-world ESD H-fields, which often have super-fast risetimes. For this reason, the Model MZT-12 H-field simulating tip is driven by the MiniZap’s contact mode simulation circuits, NOT by a slow, air-gap discharge as in some other ESD simulators.
$0.00