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Thermo Scientific Keytek Pegasus 2 Pin ESD/Curve Trace Test System

Thermo Scientific Keytek Pegasus 2 Pin ESD/Curve Trace Test System View larger

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  • Fully compliant HMM (IEC 61000-4-2 like) and HBM pods  
  • 2 pin connection, via wafer probes, to any device in a package, die, or on a wafer 
  • Thermo Scientific™ Scimitar™ Unified Software Platform to provide superior application performance  
  • Pre and Post V/I curve trace measurements for comparative failure analysis using a Keithley 2400 PSU 

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Data sheet

Contact Discharge Voltage±50 V - 12 kV (Separate 50V to8kV and 2kV to 12kV Pods)
Voltage Resolution1 V (1% of setpoint ±5 V)
Charge resistor1 ohm – 200 M ohm
Discharge Repetition 0.3 – 10 second intervals
Discharge Counter1 – 9999 count
Standards MetIEC 61000-4-2
DimensionsMain Controller Dimension 17" (W) x 17" (D) x 5.2" (H) Pod Dimension 6" (W) x 5" (D) x 3.5" (H) -
Weight18.5 Pounds (1 Pound Pods)

More info

Characterize semiconductors and integrated circuits in a package, die, or on wafer, using this 2 pin ESD/Curve Trace test system.  The Thermo Scientific™ Pegasus 2 Pin ESD/Curve Trace Test System tests semiconductor protection structures using Human Metal Model (IEC 61000-4-2 like system level) and Human Body Model waveforms. Pre and Post V/I curve trace measurements provide comparative failure analysis for quick failure determination. Automated stress current - voltage waveform capture also helps identify changes in the protection characteristics in the early stages of the test flow. - See more at: http://www.thermoscientific.com/en/product/pegasus-2-pin-esd-curve-trace-test-system.html#sthash.B82ciDkm.dpuf

Keytek Pegasues Features:

  • Fully compliant HMM (IEC 61000-4-2 like) and HBM pods  
  • 2 pin connection, via wafer probes, to any device in a package, die, or on a wafer 
  • Thermo Scientific™ Scimitar™ Unified Software Platform to provide superior application performance  
  • Pre and Post V/I curve trace measurements for comparative failure analysis using a Keithley 2400 PSU 
  • Oscilloscope interface (GPIB, USB or TCP/IP) with automated attenuation for automated waveform capture 
  • All voltage and current waveforms stored during stressing 
  • Automatic Current Waveform verification based on HMM or HBM standards 
  • Automatic Voltage Waveform capture for added protection structure analysis 
  • Multiple exporting capabilities for curve traces and waveforms 
  • Pods can easily be installed on prober stations, maintaining waveform performance
  • Easily fits on a bench top or Main Controller can be installed in a test rack 
  • Bias supply controls for Pre and Post Idd measurements (future) 
  • Wafer prober computer interface (future)

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