10 Volts to 2 kV (1 Volt Steps) Meets...
Programmable discharge voltage 200 V to 16.5 kV Stabilized charging...
Ideal for voltage bleeding to Ground Plane during Indirect ESD Immunity...
Rentals Ship Immediately Purchase Options See: Used Keytek Minizap ESD...
Suitable for EN/IEC 61000-4-2 ESD immunity compliance testing...
Rental Package Includes Air and Contact Discharge Tips Output Capability...
ESD Guns can refurbish your existing INA 405 battery pack. Expected...
Air- and contact-discharge to 30 kV Color touch panel control Advanced...
Flexibility – enables users to meet many different test specifications...
|Contact Discharge Voltage||25 Volts to 8000 Volts (±10%)|
|Voltage Resolution||1 Volt|
|Pulse networks||HBM (100 pF/1500Ω) and MM (200 pF/0Ω)|
|Discharge Repetition||10 MHz|
|Standards Met||Most Human Body Model (HBM) and Machine Model (MM) Standards including IEC 60749, IEC 61340-3, MIL-STD-883G, ESDA ANSI/ESD STM5.2, AEC-Q100, JEDEC JESD22|
High pin count devices, including computers, servers, smart phones and digital TVs are notoriously challenging to test. The Thermo Scientific™ MK.4 ESD and Latch-Up Test System provides rapid, repeatable testing of complex, high pin count (up to 2,304 pins) devices from design through post-production qualification. The exceptional high speed performance of the MK.4 system is the ideal solution for IC structure designers, R&D engineers, and QA program managers in manufacturing and test facilities in the aerospace/defense, consumer electronics and semiconductor industries.
ESD and Latch-Up testing of electronic and electrical goods can be very expensive aspects of the design and manufacturing process. This is especially true as market demands for products that are smaller, faster and smarter become the standard rather than the exception. The MK.4 ESD and Latch-Up Test System leverages our technology and know-how gained over three decades of test system experience, as well as our in-depth participation and contributions to global regulatory bodies governing these changes, enabling our products to meet both global and industry-driven quality standards.
Offers exceptional speed at least 10 times faster than mechanically driven ESD testers.
Provides consistent ESD paths and allows any pin to be grounded, floated, vectored or connected to any of the installed V/I supplies.
Ensure accurate switching of HV, in support of pulse source technology, per recent JEDEC/ESDA trailing pulse standards.
Human Body Model:
Per ESDA/JEDEC, JS-001-2012, MIL-STD 883E, and AEC Q100-002 25 V to 8 kV in steps of 1 V. Test to multiple industry standards in one integrated system; no changing or alignment of pulse sources.
Per ESDA STM5.2, JEDEC/JESD22-A115, and AEC Q100-003, 25 V to 1.5 kV in steps of 1 V. Integrated pulse sources allow fast multi-site test execution.
Per JEDEC/JESD 78 test pin and AEC Q100-004. Includes preconditioning, state read-back and full control of each. Latch-Up testing Vector input/export capability from standard tester platforms and parametric measurements.
Event trigger output:
Manages setup analysis with customized scope trigger capabilities.
Up to eight separate V/I supplies (1 stimulus and 7 bias supplies):
High accuracy DUT power, curve tracing, and Latch-up stimulus available; design also provides high current capability through the V/I matrix.
Multiple self-test diagnostic routines:
Ensures system integrity throughout the entire relay matrix, right up to the test socket.
Pre-stress, pre-fail (ESD) and post-fail data, as well as full curve trace and specific data point measurements. Data can be exported for statistical evaluation and presentation.
Individual pin parametrics:
Allows the user to define V/I levels, compliance ranges, and curve trace parameters for each pin individually.
- See more at: http://www.thermoscientific.com/en/product/mk-4-esd-latch-up-test-system.html#sthash.YR0SKLy5.dpuf