Thermo Scientific Keytek Pegasus 2 Pin ESD-Curve Trace Test System
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: In stock
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- Fully compliant HMM (IEC 61000-4-2 like) and HBM pods
- 2 pin connection, via wafer probes, to any device in a package, die, or on a wafer
- Thermo Scientific™ Scimitar™ Unified Software Platform to provide superior application performance
- Pre and Post V/I curve trace measurements for comparative failure analysis using a Keithley 2400 PSU
Category:
Characterize semiconductors and integrated circuits in a package, die, or on wafer, using this 2 pin ESD/Curve Trace test system. The Thermo Scientific™ Pegasus 2 Pin ESD/Curve Trace Test System tests semiconductor protection structures using Human Metal Model (IEC 61000-4-2 like system level) and Human Body Model waveforms. Pre and Post V/I curve trace measurements provide comparative failure analysis for quick failure determination. Automated stress current - voltage waveform capture also helps identify changes in the protection characteristics in the early stages of the test flow. - See more at: http://www.thermoscientific.com/en/product/pegasus-2-pin-esd-curve-trace-test-system.html#sthash.B82ciDkm.dpuf
Keytek Pegasues Features:
- Fully compliant HMM (IEC 61000-4-2 like) and HBM pods
- 2 pin connection, via wafer probes, to any device in a package, die, or on a wafer
- Thermo Scientific™ Scimitar™ Unified Software Platform to provide superior application performance
- Pre and Post V/I curve trace measurements for comparative failure analysis using a Keithley 2400 PSU
- Oscilloscope interface (GPIB, USB or TCP/IP) with automated attenuation for automated waveform capture
- All voltage and current waveforms stored during stressing
- Automatic Current Waveform verification based on HMM or HBM standards
- Automatic Voltage Waveform capture for added protection structure analysis
- Multiple exporting capabilities for curve traces and waveforms
- Pods can easily be installed on prober stations, maintaining waveform performance
- Easily fits on a bench top or Main Controller can be installed in a test rack
- Bias supply controls for Pre and Post Idd measurements (future)
- Wafer prober computer interface (future)
Pulse Amplitude | |
Polarity | |
Operating Modes | |
Max Output Voltage | |
Length | |
Width | |
Weight | 18.5 Pounds (1 Pound Pods) |
Height | |
Input/Shunt Resistance | |
Holding Time | |
Display | |
Discharge Repetition | 0.3 – 10 second intervals |
Discharge Detection Air Discharge | |
Discharge Counter | 1 – 9999 count |
Dimensions | Main Controller Dimension 17" (W) x 17" (D) x 5.2" (H) Pod Dimension 6" (W) x 5" (D) x 3.5" (H) - |
Contact Discharge Voltage | ±50 V - 12 kV (Separate 50V to8kV and 2kV to 12kV Pods) |
Charging Voltage Measurement | |
Battery Life | |
Bandwidth | |
Discharge Tips | |
Air Discharge Voltage | |
Voltage Resolution | 1 V (1% of setpoint ±5 V) |
Variation of Insertion Loss | |
Standards Met | IEC 61000-4-2 |
Radiation Rating | |
Pulse Networks |